Paper
19 January 2009 Tactile-optical 3D sensor applying image processing
Ulrich Neuschaefer-Rube, Mark Wissmann
Author Affiliations +
Proceedings Volume 7239, Three-Dimensional Imaging Metrology; 72390H (2009) https://doi.org/10.1117/12.810464
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States
Abstract
The tactile-optical probe (so-called fiber probe) is a well-known probe in micro-coordinate metrology. It consists of an optical fiber with a probing element at its end. This probing element is adjusted in the imaging plane of the optical system of an optical coordinate measuring machine (CMM). It can be illuminated through the fiber by a LED. The position of the probe is directly detected by image processing algorithms available in every modern optical CMM and not by deflections at the fixation of the probing shaft. Therefore, the probing shaft can be very thin and flexible. This facilitates the measurement with very small probing forces and the realization of very small probing elements (diameter: down to 10 μm). A limitation of this method is that at present the probe does not have full 3D measurement capability. At the Physikalisch-Technische Bundesanstalt (PTB), several arrangements and measurement principles for a full 3D tactile-optical probe have been implemented and tested successfully in cooperation with Werth-Messtechnik, Giessen, Germany. This contribution provides an overview of the results of these activities.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ulrich Neuschaefer-Rube and Mark Wissmann "Tactile-optical 3D sensor applying image processing", Proc. SPIE 7239, Three-Dimensional Imaging Metrology, 72390H (19 January 2009); https://doi.org/10.1117/12.810464
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optical spheres

Cameras

Speckle pattern

3D metrology

Optical components

Calibration

Image processing

Back to Top