19 January 2009 Evaluating laser range scanner lateral resolution in 3D metrology
Author Affiliations +
Proceedings Volume 7239, Three-Dimensional Imaging Metrology; 72390P (2009); doi: 10.1117/12.805868
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States
In this study, laser range scanner lateral resolution is investigated for laser range scanners. A standardized method is proposed and demonstrated for quantifying the lateral surface resolvability of a laser range scanner through the use of an appropriately-designed artefact. A new metric for lateral surface resolution, the limit of surface resolvability, is presented and is obtained using what is referred to as the wedge test. The results of applying this metrics using this test method to laser range scanners is also presented.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David MacKinnon, J. Angelo Beraldin, Luc Cournoyer, Francois Blais, "Evaluating laser range scanner lateral resolution in 3D metrology", Proc. SPIE 7239, Three-Dimensional Imaging Metrology, 72390P (19 January 2009); doi: 10.1117/12.805868; http://dx.doi.org/10.1117/12.805868

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