Open Access Paper
5 February 2009 Front Matter: Volume 7248
Proceedings Volume 7248, Wavelet Applications in Industrial Processing VI; 724801 (2009) https://doi.org/10.1117/12.824733
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 7248, including the Title Page, Copyright information, Table of Contents, and the Conference Committee listing.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 7248", Proc. SPIE 7248, Wavelet Applications in Industrial Processing VI, 724801 (5 February 2009); https://doi.org/10.1117/12.824733
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KEYWORDS
Wavelets

Digital watermarking

Image compression

Image quality

Image segmentation

Statistical modeling

Digital imaging

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