Multiridgelets for texture analysis

Hong-Jun Yoon; Ching-Chung Li

doi:10.1117/12.805626

27 January 2009 Multiridgelets for texture analysis

Hong-Jun Yoon, Ching-Chung Li

Proceedings Volume 7248, Wavelet Applications in Industrial Processing VI; 724803 (2009) https://doi.org/10.1117/12.805626
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States

Abstract

The directional wavelet used in image processing has orientation selectivity and can provide a sparse representation of edges in natural images. Multiwavelets offer the possibility of better performance in image processing applications as compared to the scalar wavelet. Applying directionality to multiwavelets may thus gain both advantages. This paper proposes a scheme, named multiridgelets, which is an extension of ridgelets. We consider the application of the balanced multiwavelet transform to the Radon transform of an image. Specifically, we consider its use in the image texture analysis. The regular polar angle method is employed to realize the discrete transform. Three statistical features: standard deviation, median, and entropy are computed based on multiridgelet coefficients. Comparative study was made with the results obtained using 2D wavelets, scalar ridgelets, and curvelets. Classification of the mura defects of the LCD screen is tested to quantify performance of the proposed texture analysis methods. 240 normal images and 240 simulated defected images are supplied to train the support vector machine classifier and another 40 normal and 40 defected images for testing. It concludes that multiridgelets were comparable to or better than curvelets and gave significant performance than 2D wavelets and scalar ridgelets.

Citation Download Citation

Hong-Jun Yoon and Ching-Chung Li "Multiridgelets for texture analysis", Proc. SPIE 7248, Wavelet Applications in Industrial Processing VI, 724803 (27 January 2009); https://doi.org/10.1117/12.805626

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