28 January 2009 New 5.5 &mgr;m interline transfer CCD platform for applied imaging markets
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Proceedings Volume 7249, Sensors, Cameras, and Systems for Industrial/Scientific Applications X; 72490C (2009); doi: 10.1117/12.806389
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States
Abstract
A new 5.5 &mgr;m pixel interline transfer CCD technology platform has been developed that offers significant improvements in performance while retaining the dynamic range, quantum efficiency, and responsivity available from the previous generation 7.4 µm pixel. Smear has been reduced to -100 dB, and a new quad-output architecture increases the maximum frame rate up to 120 fps for a 1 MPix sensor. This technology is now being deployed across a family of image sensors that share a common package and pin-out, facilitating faster camera design and product commercialization.
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Douglas A. Carpenter, James A. DiBella, Robert Kaser, Stephen L. Kosman, Xueyuan Liu, John P. McCarten, Eric J. Meisenzahl, David N Nichols, Christopher Parks, Thomas R. Pian, "New 5.5 &mgr;m interline transfer CCD platform for applied imaging markets", Proc. SPIE 7249, Sensors, Cameras, and Systems for Industrial/Scientific Applications X, 72490C (28 January 2009); doi: 10.1117/12.806389; https://doi.org/10.1117/12.806389
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KEYWORDS
Charge-coupled devices

CCD image sensors

Image sensors

Quantum efficiency

Sensors

Cameras

Electrons

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