17 November 2008 A two dimensional phase-shifting method for deflectometry
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Proceedings Volume 7266, Optomechatronic Technologies 2008; 72661L (2008) https://doi.org/10.1117/12.816472
Event: International Symposium on Optomechatronic Technologies, 2008, San Diego, California, United States
Deflectometry is widely used to measure three-dimensional profile of a specular free-form surface because of its high accuracy and short inspection time. With phase data obtained by observing the fringe patterns reflected via the surface, we can measure the shape, specifically normal vector of the surface. In order to obtain the shape of specular free-form surfaces, two different phases have to be computed for a single area. Two phases are calculated by using two sets of the phase-shifting patterns with different direction, and usually eight images are needed. In this paper, we propose a two dimensional phase-shifting method, called 2D phase-shifting method, to compute two phases with different direction with a single set of 2D phase with only five images. Therefore, the proposed method is expected to have a strong impact on measurement industry where reducing the number of acquired images is desirable for increasing measurement speed. The proposed method is verified by both simulation and experiments, in which phase information is successfully extracted with 2D phase-shifting method.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Heechan Park, Heechan Park, Deokhwa Hong, Deokhwa Hong, Hyungsuck Cho, Hyungsuck Cho, } "A two dimensional phase-shifting method for deflectometry", Proc. SPIE 7266, Optomechatronic Technologies 2008, 72661L (17 November 2008); doi: 10.1117/12.816472; https://doi.org/10.1117/12.816472


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