Open Access Paper
1 April 2009 Front Matter: Volume 7275
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 7275, including the Title Page, Copyright information, Table of Contents, and the Conference Committee listing.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 7275", Proc. SPIE 7275, Design for Manufacturability through Design-Process Integration III, 727501 (1 April 2009); https://doi.org/10.1117/12.828060
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KEYWORDS
Visualization

Semiconductors

Semiconductor manufacturing

Double patterning technology

Lithography

Microelectronics

Optical proximity correction

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