13 March 2009 Interval-value based circuit simulation for statistical circuit design
Author Affiliations +
Proceedings Volume 7275, Design for Manufacturability through Design-Process Integration III; 72750J (2009); doi: 10.1117/12.814262
Event: SPIE Advanced Lithography, 2009, San Jose, California, United States
An interval-value based circuit simulation engine is proposed to estimate the transistor-level circuit performance distribution without Monte-Carlo simulations. In the proposed flow, variability in process variables is first casted into an interval representation; then an interval-valued circuit simulator, in which all real number operations are replaced by interval operations, is used to simulate the circuit; the interval-valued simulation results can be used to extract performance statistics. A runtime reduction over both Monte-Carlo simulation and response surface modeling has been demonstrated, while excellent accuracies in transistor-level performance statistics are maintained. Future work includes incorporating non-Gaussian distributions into the interval simulation, and adapting an interval-value based framework into a design flow suitable for statistical performance optimization.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qian Ying Tang, Costas J. Spanos, "Interval-value based circuit simulation for statistical circuit design", Proc. SPIE 7275, Design for Manufacturability through Design-Process Integration III, 72750J (13 March 2009); doi: 10.1117/12.814262; https://doi.org/10.1117/12.814262

Monte Carlo methods

Device simulation

Computer simulations


Process modeling

Statistical analysis

Statistical modeling

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