Paper
20 May 2009 Optical and electrochemical properties of the protonic state electrochromic device: NiOx/Ta2O5/WO3-x
Zhuying Li, Liu Ye, Minliang Zhang, Chonglou Shun
Author Affiliations +
Proceedings Volume 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 728217 (2009) https://doi.org/10.1117/12.830861
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China
Abstract
In the present investigation, the electrochromic properties of a protonic solid state device: WO3 / Ta2O5 / NiOx prepared at room temperature (300K) is reported. The non-stoichiometric tungsten oxide thin film (100nm), the tantalum oxide thin film (360nm) and the nickel oxide thin film (50nm) are prepared by RF magnetron sputtering technique on ITO coated glass; The transmittance variation for Li+ device is +30% and for Ta+ device is -2%. The optical band gap for WO3 film is 3.11eV, for WO3 / Ta2O5 / NiOx multilayer films is 2.98eV.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhuying Li, Liu Ye, Minliang Zhang, and Chonglou Shun "Optical and electrochemical properties of the protonic state electrochromic device: NiOx/Ta2O5/WO3-x", Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 728217 (20 May 2009); https://doi.org/10.1117/12.830861
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KEYWORDS
Multilayers

Transmittance

Oxides

Thin films

Sputter deposition

Tungsten

Ions

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