20 May 2009 Vector analysis of the characteristics of diffractive microlens having common focus for a number of wavelengths
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Proceedings Volume 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 72821M (2009) https://doi.org/10.1117/12.830880
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China
Abstract
Not only harmonic diffractive microlens has a common focus for a number of discrete wavelengths, but also the ordinary diffractive microlens which is modulo 2π has a common focus for a series of discrete wavelengths, the essence reason of this phenomena is the same, such wavelengths with common focus are called harmonic wavelengths. A number of focuses are generated when monochromatic light wave illuminates an ordinary diffractive microlens. The different focus corresponds to different diffractive order. A series of harmonic wavelengths are focalized by a diffractive microlens at a common focus corresponding to their own diffractive orders. One can design achromatic aberration microlens by using the above characteristic of diffractive microlens. In this paper the diffractive microlens design method and the formula of focallength for various diffractive orders are accounted for. A multilevel diffractive microlens is analyzed by using finite-difference time-domain (FDTD) method. Two-dimensional electric field amplitude distributions for different incident harmonic wavelength are given. The electric field along optical axis for the harmonic wavelengths is plotted at the same time. The results show that the harmonic wavelengths can have common focus. Furthermore, the shorter harmonic wavelength has higher resolution, shorter focal depth, and more focuses than the longer ones.
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Yuling Liu, Yuling Liu, Chenghua Sui, Chenghua Sui, Pinggen Cai, Pinggen Cai, } "Vector analysis of the characteristics of diffractive microlens having common focus for a number of wavelengths", Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 72821M (20 May 2009); doi: 10.1117/12.830880; https://doi.org/10.1117/12.830880
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