20 May 2009 Numerical simulation of selective laser sintering transient temperature field
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Proceedings Volume 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 72821S (2009) https://doi.org/10.1117/12.830886
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China
Abstract
A numerical simulation pattern based on finite element algorithm is proposed for calculation of selective laser sintering transient temperature field. The patter is based on the transient thermal radiation and the boundary conditions is concerned soundly, particularly during the transient sintering the relation between thermal conductivity and transient sintering temperature is set up on the basis of practical test to simulate practical sinter process. As a typical and comprehensive sample, polystyrene SLS transient temperature field is analyzed. In the process of sintering the cube of 72mm×7mm×5mm, in case different parameters (laser power, scanning speed), both in a time the scanning line temperature and in a point the temperature variation with time could realize. At a time, the simulation result accords with the practical measurement result using the infrared thermometer. The results show the simulation transient sintering temperature is 252°C and that of practical measurement is 241°C with laser scanning speed 2000mm/s and laser output power 15W. the simulation transient sintering temperature is 313°C and that of practical measurement is 299°C with laser scanning speed 1750mm/s and laser output power 40W. With the simulation system of SLS transient temperature field developed in this paper, the SLS transient temperature field could be obtained rapidly and precisely to different materials and parameters, the basis of selecting sintering parameters soundly and next analyzing of stresses and defects were found firmly.
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Jian Xing, Xiaogang Sun, "Numerical simulation of selective laser sintering transient temperature field", Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 72821S (20 May 2009); doi: 10.1117/12.830886; https://doi.org/10.1117/12.830886
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