Paper
21 May 2009 Novel low area CMOS readout circuit for uncooled microbolometers with low noise
Jian Lv, Yadong Jiang, Yun Zhou, Fengwu Luo
Author Affiliations +
Proceedings Volume 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 728232 (2009) https://doi.org/10.1117/12.831015
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China
Abstract
We propose a novel CMOS readout structure without sample and hold (SH) circuit for uncooled microbolometers. In this readout circuit, all the pixels in one row can be integrated simultaneously, and the readout integrated circuit (ROIC) area can be reduced by as much as 30%. Moreover, a single capacitor implementation of both capacitive transimpedance amplifier (CTIA) and correlated double sampling (CDS) is utilized to improve noise performance. An experimental 40x30 ROIC chip has been designed and fabricated with 0.5 μm CMOS technology. The test results show that the ROIC has good linearity with 260μV RMS total output noise voltage and 1800x650 μm2 total circuit area.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jian Lv, Yadong Jiang, Yun Zhou, and Fengwu Luo "Novel low area CMOS readout circuit for uncooled microbolometers with low noise", Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 728232 (21 May 2009); https://doi.org/10.1117/12.831015
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Microbolometers

Cadmium sulfide

Readout integrated circuits

Capacitors

Clocks

Amplifiers

Bolometers

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