20 May 2009 Study on surface topography of IBS oxide multilayer mirrors
Author Affiliations +
Abstract
The surface topography of oxide multilayer mirrors with Ion Beam Sputtering (IBS) technology is experimentally investigated by Atomic Force Microscope (AFM). Different film materials, substrates polishing and cleaning methods are experimented for promoting the mirrors quality, respectively. PSD (Power Spectral Density) characteristic of different substrates and films has been compared. Surface roughness with different polished methods has been analyzed too. The result shows that the depositional property of film materials determines the principal characteristic of mirror surface topography, and the substrate polishing and cleaning quality mostly affects the mirror optical quality.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yong Chen, Yong Chen, Xiao Zhang, Xiao Zhang, Fan Shan, Fan Shan, Boxiong Chen, Boxiong Chen, } "Study on surface topography of IBS oxide multilayer mirrors", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830R (20 May 2009); doi: 10.1117/12.828614; https://doi.org/10.1117/12.828614
PROCEEDINGS
5 PAGES


SHARE
Back to Top