Experimental study of alignment method for a positive-branch confocal unstable resonator based on H-S wavefront sensor

Xiang Zhang; Qing Cai; Anping Xiang

doi:10.1117/12.828710

20 May 2009 Experimental study of alignment method for a positive-branch confocal unstable resonator based on H-S wavefront sensor

Xiang Zhang, Qing Cai, Anping Xiang

Author Affiliations +

Proceedings Volume 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 72832F (2009) https://doi.org/10.1117/12.828710
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

The experimental adjustment method for a positive-branch confocal unstable resonator has been studied and a method for estimating the alignment for unstable resonators has been suggested. The output beam intensity and phase properties should be used together to judge whether the unstable resonator is been aligned exactly. Firstly, the optical axis of the resonator must be aligned and the intensity properties of output beam should be symmetrical distribution for the adjusted unstable resonator, however, some high-order aberrations such as defocus may be still included in the outcoupled beam. In this paper, the beam is detected by using Hartmann-Shack (H-S) wavefront sensor and the phase properties can be further acquired by adopting Zernike mode-reconstruction theory. By such means, the phase PV and RMS values, the 35-order Zernike aberrations, and the distribution of circle energy can all be obtained, and the beam-quality can be known fully. So the resonator can be adjusted according to the measured Zernike aberrations and also the ideal condition of alignment can be acquired.

Citation Download Citation

Xiang Zhang, Qing Cai, and Anping Xiang "Experimental study of alignment method for a positive-branch confocal unstable resonator based on H-S wavefront sensor", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72832F (20 May 2009); https://doi.org/10.1117/12.828710

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