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20 May 2009 Study on bi-color phase measurement deflectometry
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Abstract
Phase Measuring Deflectometry(PMD), which is aimed at testing specular free-form surfaces, has been developed in recent years. Normally, two sets of sinusoidal fringe patterns are needed, i.e. horizontal and vertical fringe patterns. So it will be time-consuming in PMD system while pursing high accuracy. Here we propose a Bi-color PMD system that will produce one frame fringe consisting of two interlaced RGB format base color fringe patterns, i.e. vertical pattern and horizontal pattern. The fringe patterns could be captured by color camera and the absolute phase will be got by phase-shift technique. It could lead to a faster measuring process and make PMD technique more useful.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuankun Liu, Xianyu Su, and Qican Zhang "Study on bi-color phase measurement deflectometry", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728349 (20 May 2009); https://doi.org/10.1117/12.828819
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