Research of measuring instrument with freeform surface

Yuanyuan Wang; Jingchi Yu; Ying Ni; Jia Qu; Hao Chen

doi:10.1117/12.828820

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20 May 2009 Research of measuring instrument with freeform surface

Yuanyuan Wang; Jingchi Yu; Ying Ni; Jia Qu; Hao Chen

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Proceedings Volume 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 72834A (2009) https://doi.org/10.1117/12.828820
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

In this paper, the principle, method and model of the instrument for measuring aspheric and freeform surface are described. This new type of profilometer which possesses differential measurement and polar-coordinate measurement functions is built on an ultra-precision air bearing stage. When using differential measurement, the radius of the best fit sphere of the tested aspheric surface is selected as reference to define the theoretical difference between the best fit sphere and the tested aspheric surface. After comparing the measurement results with the theoretical calculated results, we will obtain the surface error of the measured aspherical surface. With this method, the dynamic measurement range can be greatly reduced, which improves the measurement precision consequently. This surface profilometer can also be used to measure the surface of progressive addition lens (PAL). As an example, measurement of the freeform lens is given in this paper. The advantages of this device are easy for operation and highly précised.

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Yuanyuan Wang, Jingchi Yu, Ying Ni, Jia Qu, and Hao Chen "Research of measuring instrument with freeform surface", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72834A (20 May 2009); https://doi.org/10.1117/12.828820

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