20 May 2009 Evaluation method of circular optical surfaces through power spectral density
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Proceedings Volume 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 72834J (2009); doi: 10.1117/12.828829
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China
Abstract
As the key for supplying safe and normal running of whole optical system, it is important to test and evaluate the quality of optical components. The wavefront power spectral density (PSD) can give spatial frequency distribution of wavefront aberration and specify optical components. Based on summarizing the existing PSD specification, one dimension radial PSD is used for specifying the character of the spatial frequency distribution of wavefront aberration about the circular optical surfaces is advanced. Its calculation of PSD for testing circular optical surface with interferometer test instrument is explored in the paper.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Chen, "Evaluation method of circular optical surfaces through power spectral density", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72834J (20 May 2009); doi: 10.1117/12.828829; https://doi.org/10.1117/12.828829
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KEYWORDS
Spatial frequencies

Wavefront aberrations

Wavefronts

Optical testing

Interferometers

Optical components

Surface roughness

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