30 March 2009 Thin-film active nano-PWAS for structural health monitoring
Author Affiliations +
Abstract
Structural health monitoring (SHM) is an emerging field in which smart materials interrogate structural components to predict failure, expedite needed repairs, and thus increase the useful life of those components. Piezoelectric wafer active sensors (PWAS) have been previously adhesively-bonded to structures and demonstrate the ability to detect and locate cracking, corrosion, and disbonding through use of pitch-catch, pulse-echo, electro/mechanical impedance, and phased array technology. The present research considers structurally-integrated PWAS that can be fabricated directly to the structural substrate using thin-film nano technologies (e.g., pulsed-laser deposition, sputtering, chemical vapor deposition, etc.) Because these novel PWAS are made up of nano layers they are dubbed nano-PWAS. Nano-PWAS research consists of two parts, thin-film fabrication and nano-PWAS construction. The first part is how to fabricate the piezoelectric thin-film on structure materials. In our research, ferroelectric BaTiO3 (BTO) thin films were successfully deposited on structure material Ni and Ti by pulsed laser deposition under the optimal synthesis conditions. Microstructural studies revealed that the as-grown BTO thin films have the nanopillar structures and the good interface structures with no inter-diffusion or reaction. The dielectric and ferroelectric property measurements exhibit that the BTO films have a relatively large dielectric constant, a small dielectric loss, and an extremely large piezoelectric response with a symmetric hysteresis loop. The second part is nano-PWAS construction and how they are related to the active SHM interrogation methods. Nano-PWAS architecture achieved through thin-film deposition technology and its potential application for SHM were discussed here. The research objective is to develop the fabrication and optimum design of thin-film nano-PWAS for structural health monitoring applications.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bin Lin, Victor Giurgiutiu, Amar S. Bhalla, Chonglin Chen, Ruyan Guo, Jiechao Jiang, "Thin-film active nano-PWAS for structural health monitoring", Proc. SPIE 7292, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2009, 72921M (30 March 2009); doi: 10.1117/12.814397; https://doi.org/10.1117/12.814397
PROCEEDINGS
12 PAGES


SHARE
Back to Top