7 January 2009 Mossbauer backscattering measurements on Sn
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Proceedings Volume 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV; 72971T (2009) https://doi.org/10.1117/12.823676
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 2008, Constanta, Romania
Abstract
We prove the possibility to make superficial measurements in the nano or micro range by Mossbauer spectroscopy using 119Sn Mossbauer isotope. Measurements were made with a new flow gas detector in a backscattering geometry. With this detector was possibly to detect conversion electron or low energy X-ray. A β-Sn metallic foil sample was used. These measurements were performed for the first time in Romania. After our knowledge the detection of low energy X-ray for 119Sn is realized for the first time in the world.
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I. Bibicu, G. Nicolescu, C. Cretu, "Mossbauer backscattering measurements on Sn", Proc. SPIE 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 72971T (7 January 2009); doi: 10.1117/12.823676; https://doi.org/10.1117/12.823676
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