7 January 2009 Advanced concepts in nanomanipulations
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Proceedings Volume 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV; 72971Z (2009) https://doi.org/10.1117/12.823683
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 2008, Constanta, Romania
Abstract
Atomic force microscopes and scanning tunneling microscopes can be used to look at surfaces and to move atoms around. By designing different tips for these microscopes, they can be used for carving out structures on surfaces and to help guide self-assembling structures. The top-down approach anticipates nanodevices that must be built piece by piece in stages, much as manufactured items are made. The properties such as non-linearity, oversensitivity to environmental parameters, geometrical/material-dependence, etc. result in the particular design of each nanomanipulation task according to specific conditions and disturbances. The precision and the speed of nanomanipulation are two important factors in the construction of a dimensionally well-defined pattern in a minimum amount of time.
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Gabriel T. Raicu, Costel I. Stanca, "Advanced concepts in nanomanipulations", Proc. SPIE 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 72971Z (7 January 2009); doi: 10.1117/12.823683; https://doi.org/10.1117/12.823683
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