7 January 2009 A method for reliability estimation of heterogeneous systems
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Proceedings Volume 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV; 72972H (2009) https://doi.org/10.1117/12.823701
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 2008, Constanta, Romania
Abstract
Reliability estimation is becoming an important issue of the design process of complex heterogeneous systems. The concept of reliability is frequently seen as being one of the least controlled points and for some as being the critical point. Since these systems are very complex to study, the evaluation of their reliability is extremely difficult. In this paper, we propose a global method to estimate the mechatronic system reliability using operating field data. Since we have a small amount of data, we use an estimation method called Bayesian Restoration Maximization (BRM) method, thus increasing the estimation accuracy. The BRM method needs to define some prior knowledge. For this purpose, we propose to define the prior distribution using a Monte-Carlo simulation based on stochastic Petri Nets (SPN) model and on the operating field data. The stochastic PN model describes the functional and dysfunctional behaviours. In this study, we deal with the case of n repairable systems until a deterministic censoring time (for example, this censoring time may be the warranty period of an ABS system). We consider repair as the replacement of the failing component by an identical one in the case of electronic and mechanical subsystem and in the case of software, the default is rectified on all the subsystems. We simulate the failures times and we compute the confidence interval. The proposed method allows reliability evaluating both for n mechatronic systems and for their different subsystems.
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Alin Mihalache, Alin Mihalache, Fabrice Guérin, Fabrice Guérin, Mihaela Barreau, Mihaela Barreau, Alexis Todoskoff, Alexis Todoskoff, Ioan Bacivarov, Ioan Bacivarov, Angelica Bacivarov, Angelica Bacivarov, } "A method for reliability estimation of heterogeneous systems", Proc. SPIE 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 72972H (7 January 2009); doi: 10.1117/12.823701; https://doi.org/10.1117/12.823701
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