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18 May 1987 Developments In Image Processing For Industrial Inspection
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Proceedings Volume 0730, Automated Inspection and Measurement; (1987) https://doi.org/10.1117/12.937855
Event: Cambridge Symposium_Intelligent Robotics Systems, 1986, Cambridge, MA, United States
Abstract
The suitability of a number of systems architectures for use in industrial inspection machines is briefly reviewed. Two different pipe-line processors, a (linear) array processor, an array of transputers, a concurrent array of (non-interconnected) von Neumann machines are all discussed. Where possible, measured execution speeds are given. The article concludes that no one system yet available is able to fulfil anything approaching a significant proportion of all inspection requirements. However, a clear view of the short-term future emerges, in which a combination of certain current ideas is perceived as providing a basis for a far more cost-effective 'general purpose' image processing system for industrial inspection than we have yet enjoyed.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. G. Batchelor, C. C. Bowman, K. W. Chow, S. J. Goodman, D. E. Kelly, A. J. McCollum, and S. M. Rowland "Developments In Image Processing For Industrial Inspection", Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); https://doi.org/10.1117/12.937855
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