Opto-Electronic Profile Measuring System

Harald J. Schmalfuss

doi:10.1117/12.937860

18 May 1987 Opto-Electronic Profile Measuring System

Harald J. Schmalfuss

Proceedings Volume 0730, Automated Inspection and Measurement; (1987) https://doi.org/10.1117/12.937860
Event: Cambridge Symposium_Intelligent Robotics Systems, 1986, Cambridge, MA, United States

Abstract

The basic idea of a simple, but powerful opto-electronic profile measuring system and three practical examples are described. In general these systems are combinations of classical light sectioning techniques, modern sensors and special digital hardware components. Further applications, e.g. in the steel or automotive industry are possible.

Citation Download Citation

Harald J. Schmalfuss "Opto-Electronic Profile Measuring System", Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); https://doi.org/10.1117/12.937860

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available