Parallel Edge Detection

Yen C. Chu

doi:10.1117/12.937863

18 May 1987 Parallel Edge Detection

Yen C. Chu

Proceedings Volume 0730, Automated Inspection and Measurement; (1987) https://doi.org/10.1117/12.937863
Event: Cambridge Symposium_Intelligent Robotics Systems, 1986, Cambridge, MA, United States

Abstract

Parallel edges often provide a unique local feature for part recognition in manufacturing automation or robotic guidance applications. This paper discusses a simple parallel edge detection algorithm which takes the parallel edge as one entity instead of two separate edges. A special edge detection algorithm, step-state reasoning, is also discussed in this paper. The application of the algorithm and its accuracy and repeatability are discussed in the paper.

Citation Download Citation

Yen C. Chu "Parallel Edge Detection", Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); https://doi.org/10.1117/12.937863

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