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18 May 1987 Parallel Edge Detection
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Proceedings Volume 0730, Automated Inspection and Measurement; (1987) https://doi.org/10.1117/12.937863
Event: Cambridge Symposium_Intelligent Robotics Systems, 1986, Cambridge, MA, United States
Abstract
Parallel edges often provide a unique local feature for part recognition in manufacturing automation or robotic guidance applications. This paper discusses a simple parallel edge detection algorithm which takes the parallel edge as one entity instead of two separate edges. A special edge detection algorithm, step-state reasoning, is also discussed in this paper. The application of the algorithm and its accuracy and repeatability are discussed in the paper.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yen C. Chu "Parallel Edge Detection", Proc. SPIE 0730, Automated Inspection and Measurement, (18 May 1987); https://doi.org/10.1117/12.937863
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