22 April 2009 Controllable time dependent and dual band emission infrared source to test missile warning systems in-flight: system characterization
Author Affiliations +
Proliferation and technological progress of Mid Wave Infrared (MWIR) sensors for Missile Warning Systems (MWS)1,2 and increased sophistication of countermeasures require more demanding in-flight testing. Spectral discrimination is being introduced for higher specificity and lower false alarms. As a result, testing such spectrally more capable systems requires a more spectrally capable stimulator. In a previous paper3 we have described a system we developed to test missile warning systems mounted on an aircraft. The system is placed in the field and projects a time dependent infrared beam towards the flying aircraft, simulating the infrared emittance of an approaching missile in the 3 to 5 micron spectral range as sensed by an MWS system. It can be used also as a trainer for the pilot himself to practice his/her reaction to being targeted. Now we have developed a new system based on the above concept but allowing the user to synchronously produce time profiles of two different infrared ranges independently within the 3 to 5 micron range (3.5 to 4 and 4.5 to 4.8 μ). This new dual color system (the DCIRTS) can now be used stationary or mounted on a vehicle while traveling, for even more realistic simulation. In this paper we describe the DCIRTS and its capability. The system design was presented in a previous paper (reference 4), but now after assembly and preliminary testing, we show the actual system performance and most important physical characteristics.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dario Cabib, Dario Cabib, Larry Davidzon, Larry Davidzon, Amir Gil, Amir Gil, } "Controllable time dependent and dual band emission infrared source to test missile warning systems in-flight: system characterization", Proc. SPIE 7300, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XX, 73000W (22 April 2009); doi: 10.1117/12.818890; https://doi.org/10.1117/12.818890

Back to Top