28 April 2009 Measurement results for time-delayed source interferometers for windows, hemispherical domes, and tangent ogives
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Proceedings Volume 7302, Window and Dome Technologies and Materials XI; 73020R (2009); doi: 10.1117/12.818386
Event: SPIE Defense, Security, and Sensing, 2009, Orlando, Florida, United States
Abstract
A time-delayed source interferometer manipulates the output of a short-coherence length source so that light reflected from the two surfaces of a nominally constant-thickness optical component interfere. The interference pattern is a measure of optical thickness variation and can be phase-shifted. The approach is well suited to optical components that are nominally constant thickness over some portion of the surface. Interferometers suited to the measurement of windows, hemispherical domes and tangent ogives have been built. Data acquisition, calibration tooling and processing methods are described for the stitching of phase data.
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William P. Kuhn, Matthew B. Dubin, Robert S. LeCompte, Hector P. Durazo, "Measurement results for time-delayed source interferometers for windows, hemispherical domes, and tangent ogives", Proc. SPIE 7302, Window and Dome Technologies and Materials XI, 73020R (28 April 2009); doi: 10.1117/12.818386; https://doi.org/10.1117/12.818386
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KEYWORDS
Interferometers

Domes

Wavefronts

Calibration

Data acquisition

Cameras

Objectives

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