Lu3Al5O12-based materials for high 2D-resolution scintillation detectors

M. Nikl; J. Tous; J. A. Mares; P. Prusa; E. Mihokova; K. Blazek; A. Vedda; Yu. Zorenko; V. Gorbenko; V. Babin

doi:10.1117/12.818358

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30 April 2009 Lu₃Al₅O₁₂-based materials for high 2D-resolution scintillation detectors

M. Nikl, J. Tous, J. A. Mares, P. Prusa, E. Mihokova, K. Blazek, A. Vedda, Yu. Zorenko, V. Gorbenko, V. Babin

Proceedings Volume 7310, Non-Intrusive Inspection Technologies II; 731008 (2009) https://doi.org/10.1117/12.818358
Event: SPIE Defense, Security, and Sensing, 2009, Orlando, Florida, United States

Abstract

About 20 μm thick Ce-doped Lu₃Al₅O₁₂ thin films grown by Liquid Phase Epitaxy and thin plates of similar thickness prepared by mechanical cutting and polishing from Czochralski grown crystals are used in 2D-imaging experiment down to μm 2D-resolution. Their scintillation response is also measured under α-particle excitation and performance of film and bulk material is mutually compared. Furthermore, scintillation and thermoluminescence characteristics of UV emitting Sc-doped LuAG grown by Czochralski method are presented since this system is a candidate material for UV emission-based 2D sensors with improved diffraction limit with respect to the presently used Ce-doped aluminum garnets.

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M. Nikl, J. Tous, J. A. Mares, P. Prusa, E. Mihokova, K. Blazek, A. Vedda, Yu. Zorenko, V. Gorbenko, and V. Babin "Lu₃Al₅O₁₂-based materials for high 2D-resolution scintillation detectors", Proc. SPIE 7310, Non-Intrusive Inspection Technologies II, 731008 (30 April 2009); https://doi.org/10.1117/12.818358

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