Terahertz backscattering behavior of various absorbing materials

C. Wu; A. J. Gatesman; L. DeRoeck; T. Horgan; R. H. Giles; W. E. Nixon

doi:10.1117/12.822189

30 April 2009 Terahertz backscattering behavior of various absorbing materials

C. Wu, A. J. Gatesman, L. DeRoeck, T. Horgan, R. H. Giles, W. E. Nixon

Author Affiliations +

Proceedings Volume 7311, Terahertz Physics, Devices, and Systems III: Advanced Applications in Industry and Defense; 73110M (2009) https://doi.org/10.1117/12.822189
Event: SPIE Defense, Security, and Sensing, 2009, Orlando, Florida, United States

Abstract

The Submillimeter-Wave Technology Laboratory (STL) at the University of Massachusetts Lowell has investigated the electromagnetic scattering behavior of various broadband absorbers. Several absorbing materials were tested in a compact radar range operating at a center frequency of 160 GHz. The polarimetric radar cross section was measured at elevation angles from 15° to 75°. In addition to the backscattering behavior, the normal incidence transmittance of the materials was evaluated.

Citation Download Citation

C. Wu, C. Wu, A. J. Gatesman, A. J. Gatesman, L. DeRoeck, L. DeRoeck, T. Horgan, T. Horgan, R. H. Giles, R. H. Giles, W. E. Nixon, W. E. Nixon, } "Terahertz backscattering behavior of various absorbing materials", Proc. SPIE 7311, Terahertz Physics, Devices, and Systems III: Advanced Applications in Industry and Defense, 73110M (30 April 2009); doi: 10.1117/12.822189; https://doi.org/10.1117/12.822189

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