30 April 2009 Terahertz backscattering behavior of various absorbing materials
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The Submillimeter-Wave Technology Laboratory (STL) at the University of Massachusetts Lowell has investigated the electromagnetic scattering behavior of various broadband absorbers. Several absorbing materials were tested in a compact radar range operating at a center frequency of 160 GHz. The polarimetric radar cross section was measured at elevation angles from 15° to 75°. In addition to the backscattering behavior, the normal incidence transmittance of the materials was evaluated.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Wu, C. Wu, A. J. Gatesman, A. J. Gatesman, L. DeRoeck, L. DeRoeck, T. Horgan, T. Horgan, R. H. Giles, R. H. Giles, W. E. Nixon, W. E. Nixon, } "Terahertz backscattering behavior of various absorbing materials", Proc. SPIE 7311, Terahertz Physics, Devices, and Systems III: Advanced Applications in Industry and Defense, 73110M (30 April 2009); doi: 10.1117/12.822189; https://doi.org/10.1117/12.822189


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