27 April 2009 Longwave multispectral diffractive optic imaging spectrometer
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Ann Arbor Sensor Systems is developing and experimenting with a Long Wave Multispectral Diffractive Optic Imaging Spectrometer that operates in the 7 to 14 micron band. The instrument currently under development is for fixed mount applications. The focal plane is an uncooled 320 x 240 30 micron pitch amorphous silicon microbolometer array. With a spectral bandwidth of 220nm the unit is capable of resolving moderate to broad spectral features. This paper will describe the physical characteristics and characterization of the experimental device. Design trades and test data will be presented.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David Kryskowski, David Kryskowski, Justin Renken, Justin Renken, } "Longwave multispectral diffractive optic imaging spectrometer", Proc. SPIE 7334, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XV, 73340G (27 April 2009); doi: 10.1117/12.819070; https://doi.org/10.1117/12.819070

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