28 April 2009 Topological quantum image analysis
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Proceedings Volume 7342, Quantum Information and Computation VII; 73420C (2009); doi: 10.1117/12.817053
Event: SPIE Defense, Security, and Sensing, 2009, Orlando, Florida, United States
Abstract
A new approach to analyzing visual images is proposed, based on the idea of converting an optical image into a spatially varying pattern of polarized squeezed light, which is then used to produce a pattern of chiral edge currents in a thin film topological insulator. Thin films of Bi or Bi doped with Sb which are punctured with an array of sub-micron holes may be a way of realizing this kind of optical quantum information processing.
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George Chapline, Jonathan L. DuBois, "Topological quantum image analysis", Proc. SPIE 7342, Quantum Information and Computation VII, 73420C (28 April 2009); doi: 10.1117/12.817053; https://doi.org/10.1117/12.817053
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KEYWORDS
Image analysis

Thin films

Bismuth

Quantum information processing

Magnetism

Pattern recognition

Sensors

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