Paper
30 April 2009 Active microstructured x-ray optical arrays
Alan G. Michette, Slawka J. Pfauntsch, Shahin Sahraei, Matthew Shand, Graeme R. Morrison, David Hart, Boris Vojnovic, Tom Stevenson, William Parkes, Camelia Dunare, Richard Willingale, Charlotte H. Feldman, Tim W. Button, Dou Zhang, Daniel Rodriguez-Sanmartin, Hongchang Wang, Andy D. Smith
Author Affiliations +
Abstract
The UK Smart X-Ray Optics consortium is developing novel reflective adaptive/active x-ray optics for small-scale laboratory applications, including studies of radiation-induced damage to biological material. The optics work on the same principle as polycapillaries, using configured arrays of channels etched into thin silicon, such that each x-ray photon reflects at most once off a channel wall. Using two arrays in succession provides two reflections and thus the Abbe sine condition can be approximately satisfied, reducing aberrations. Adaptivity is achieved by flexing one or both arrays using piezo actuation, which can provide further reduction of aberrations as well as controllable focal lengths. Modelling of such arrays for used on an x-ray microprobe, based on a microfocus source with an emitting region approximately 1μm in diameter, shows that a focused flux approximately two orders of magnitude greater than possible with a zone plate of comparable focal length is possible, assuming that the channel wall roughness is less than about 2nm.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alan G. Michette, Slawka J. Pfauntsch, Shahin Sahraei, Matthew Shand, Graeme R. Morrison, David Hart, Boris Vojnovic, Tom Stevenson, William Parkes, Camelia Dunare, Richard Willingale, Charlotte H. Feldman, Tim W. Button, Dou Zhang, Daniel Rodriguez-Sanmartin, Hongchang Wang, and Andy D. Smith "Active microstructured x-ray optical arrays", Proc. SPIE 7360, EUV and X-Ray Optics: Synergy between Laboratory and Space, 736007 (30 April 2009); https://doi.org/10.1117/12.820171
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Cited by 3 scholarly publications.
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KEYWORDS
X-rays

X-ray optics

Reflectivity

Silicon

Neodymium

Etching

Chromium

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