30 April 2009 A generic x-ray tracing toolbox in Geant4
Author Affiliations +
Proceedings Volume 7360, EUV and X-Ray Optics: Synergy between Laboratory and Space; 73600Z (2009); doi: 10.1117/12.821768
Event: SPIE Optics + Optoelectronics, 2009, Prague, Czech Republic
Abstract
We have developed a generic X-ray tracing toolbox based on Geant4, a generic simulation toolkit. By leveraging the facilities available on Geant4, we are able to design and analyze complex X-ray optical systems. In this article we describe our toolbox, and describe how it is being applied to support the development of silicon pore optics for IXO.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giuseppe Vacanti, Ernst-Jan Buis, Maximilien Collon, Marco Beijersbergen, Chris Kelly, "A generic x-ray tracing toolbox in Geant4", Proc. SPIE 7360, EUV and X-Ray Optics: Synergy between Laboratory and Space, 73600Z (30 April 2009); doi: 10.1117/12.821768; https://doi.org/10.1117/12.821768
PROCEEDINGS
8 PAGES


SHARE
KEYWORDS
X-rays

Particles

Mirrors

X-ray optics

Silicon

Photons

Physics

RELATED CONTENT

Silicon pore x-ray optics for IXO
Proceedings of SPIE (July 29 2010)
Performance of silicon pore optics
Proceedings of SPIE (July 15 2008)
Channeling radiation: history of discovery, status, and use
Proceedings of SPIE (December 07 2006)

Back to Top