Modelling of damage processes of the optical-cryogenic sensor at microscopic and macroscopic levels

Vitaliy Yatsenko; Leonid Yatsenko; Anatoliy Negriyko; Janna Potemkina; Elena Udovitskaya

doi:10.1117/12.822604

18 May 2009 Modelling of damage processes of the optical-cryogenic sensor at microscopic and macroscopic levels

Vitaliy Yatsenko, Leonid Yatsenko, Anatoliy Negriyko, Janna Potemkina, Elena Udovitskaya

Proceedings Volume 7361, Damage to VUV, EUV, and X-Ray Optics II; 73610G (2009) https://doi.org/10.1117/12.822604
Event: SPIE Optics + Optoelectronics, 2009, Prague, Czech Republic

Abstract

The report will be devoted to the modelling of damage processes of the optical-cryogenic sensor at microscopic and macroscopic levels. The sensor is based on a new type of suspension of the probe of a supeconducting gravimeter. The interferometric method is provided coordinate measurement of the probe. The following main subjects will be covered by the report: (1) modelling of a supeconducting gravimeter; (2) modeling of a solid-state laser; (3) computer simulation of damage processes at microscopic and macroscopic levels; (4) response of thin films to intense short-wavelength radiation; (5) mathematical models for dynamic probabilistic risk assessment; (6) strategies for the design of optical components, and (7) software for modeling and prediction of ionizing radiation. For computer simulation of damage processes at microscopic and macroscopic levels the following methods are used: () statistical; (b) dynamical; (c) optimization; (d) acceleration modeling, and (e) mathematical modeling of laser functioning. Mathematical models of space ionizing radiation influence on gravimwter elements were developed for risk assessment in laser safety analysis.

Citation Download Citation

Vitaliy Yatsenko, Leonid Yatsenko, Anatoliy Negriyko, Janna Potemkina, and Elena Udovitskaya "Modelling of damage processes of the optical-cryogenic sensor at microscopic and macroscopic levels", Proc. SPIE 7361, Damage to VUV, EUV, and X-Ray Optics II, 73610G (18 May 2009); https://doi.org/10.1117/12.822604

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