Paper
18 May 2009 Characterization and simulation of high-quality AlN-actuated resonant suspended beams
Author Affiliations +
Proceedings Volume 7362, Smart Sensors, Actuators, and MEMS IV; 73620K (2009) https://doi.org/10.1117/12.821636
Event: SPIE Europe Microtechnologies for the New Millennium, 2009, Dresden, Germany
Abstract
Micro-cantilevers and micro-bridges actuated by sputter-deposited aluminium nitride (AlN) thin films were measured with a scanning laser Doppler vibrometer up to 6 MHz, covering more than 10 resonance modes of different nature. A finite element model (FEM) was used to simulate the modal response of the micromachined structures. The comparison between experiment and simulation, regarding modal shapes and frequencies, resulted in an excellent agreement, what confirmed the quality of the structures. Finally, we point out, and illustrate with the help of micro-bridges, the importance for a locally tailored distribution of electrical excitation on the top surface of the device, in order to either optimize or cancel out the displacement of a given mode.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Hernando, J. L. Sánchez-Rojas, A. Ababneh, H. Seidel, Ü. Sökmen, E. Peiner, and U. Schmid "Characterization and simulation of high-quality AlN-actuated resonant suspended beams", Proc. SPIE 7362, Smart Sensors, Actuators, and MEMS IV, 73620K (18 May 2009); https://doi.org/10.1117/12.821636
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Cited by 8 scholarly publications.
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KEYWORDS
Electrodes

Aluminum nitride

Finite element methods

Bridges

Silicon

Etching

Aluminum

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