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20 May 2009 Ratiometric wavelength monitor using a pair of symmetrical multimode interference structures based on silicon-on-insulator (SOI)
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Proceedings Volume 7366, Photonic Materials, Devices, and Applications III; 73660S (2009) https://doi.org/10.1117/12.821214
Event: SPIE Europe Microtechnologies for the New Millennium, 2009, Dresden, Germany
Abstract
An integrated ratiometric wavelength monitor consisting of a Y-branch and a pair of symmetrical multimode interference structures (MMI) based on silicon-on-insulator (SOI) is investigated numerically. Two symmetrical MMIs are optimized in terms of width and length to achieve overlapping opposite slope spectral responses. The designed ratiometric structure demonstrates a suitable spectral response for wavelength measurement, with a high resolution over a 100 nm wavelength range.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Agus Muhamad Hatta, Gerald Farrell, Yuliya Semenova, and Harendra Fernando "Ratiometric wavelength monitor using a pair of symmetrical multimode interference structures based on silicon-on-insulator (SOI)", Proc. SPIE 7366, Photonic Materials, Devices, and Applications III, 73660S (20 May 2009); https://doi.org/10.1117/12.821214
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