An optically sectioning microscopy technique based on oblique selective plane illumination combined with oblique
imaging is described. The same high numerical aperture lens is used to both illuminate and image the specimen and
correction optics are employed to tilt the focal plane of the imaging system so that the imaged plane aligns with the
illuminated plane in the specimen. An optically sectioned image is obtained without the use of moving parts or image
processing and this technique therefore has the potential to be used for very high speed optically sectioned microscopy.
As only the part of the specimen that is being imaged is illuminated then the photobleaching and phototoxicity of this
method is low compared to conventional microscopy techniques.