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1 July 2009 Super-resolved position and orientation of fluorescent dipoles
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Abstract
We introduce an efficient, image formation model-based algorithm that extends super-resolution fluorescence localization to include orientation estimation, and report experimental accuracies of 5 nanometers for position estimation and 2 degrees for dipole orientation estimation.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
François Aguet, Stefan Geissbühler, Iwan Märki, Theo Lasser, and Michael Unser "Super-resolved position and orientation of fluorescent dipoles", Proc. SPIE 7367, Advanced Microscopy Techniques, 73670Y (1 July 2009); doi: 10.1117/12.831488; https://doi.org/10.1117/12.831488
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