7 July 2009 Darkfield scattering spectroscopic microscopy evaluation using polystyrene beads
Author Affiliations +
Diameters of single polystyrene beads were determined within ~10 nm accuracy by comparing Mie theory oscillations and wavelength resolved measurements. The setup is realized with an axicon supported reflected darkfield microscope and is herein presented in detail. Further we explain a theoretical model considering the effective numerical aperature of the measuring system. A fitting algorithm allows rapid characterization of the sphere diameters.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael Schmitz, René Michels, Alwin Kienle, "Darkfield scattering spectroscopic microscopy evaluation using polystyrene beads", Proc. SPIE 7368, Clinical and Biomedical Spectroscopy, 73681W (7 July 2009); doi: 10.1117/12.831591; https://doi.org/10.1117/12.831591

Back to Top