7 July 2009 Darkfield scattering spectroscopic microscopy evaluation using polystyrene beads
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Abstract
Diameters of single polystyrene beads were determined within ~10 nm accuracy by comparing Mie theory oscillations and wavelength resolved measurements. The setup is realized with an axicon supported reflected darkfield microscope and is herein presented in detail. Further we explain a theoretical model considering the effective numerical aperature of the measuring system. A fitting algorithm allows rapid characterization of the sphere diameters.
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Michael Schmitz, René Michels, Alwin Kienle, "Darkfield scattering spectroscopic microscopy evaluation using polystyrene beads", Proc. SPIE 7368, Clinical and Biomedical Spectroscopy, 73681W (7 July 2009); doi: 10.1117/12.831591; https://doi.org/10.1117/12.831591
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