25 August 2009 Size-dependent and orientation-dependent Young's modulus of silicon nanowires
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Proceedings Volume 7375, ICEM 2008: International Conference on Experimental Mechanics 2008; 73753E (2009) https://doi.org/10.1117/12.839253
Event: International Conference on Experimental Mechanics 2008 and Seventh Asian Conference on Experimental Mechanics, 2008, Nanjing, China
Abstract
We use molecular dynamical software Material StudioTM to investigate Young's moduli of Silicon nanowires along [001], [110] and [111] directions. Young's moduli for various directional and sized specimens are obtained via the energy-strain curves. The study suggests that the Young's modulus decreases as the thickness of the specimen decreases especially for the [001] direction, which display the peculiarity of anisotropy and size dependence. In comparison with the bulk silicon, the overall nanowires become soften for all the three directions. With respect to the results reported, similar trend is observed but magnitude of Young's modulus is not the same with each other. We analyze the dependence of Young's modulus on the size, surface structure and boundary conditions.
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Li-Bing Lu, Hong Yu, Wei-Wei Zhang, "Size-dependent and orientation-dependent Young's modulus of silicon nanowires", Proc. SPIE 7375, ICEM 2008: International Conference on Experimental Mechanics 2008, 73753E (25 August 2009); doi: 10.1117/12.839253; https://doi.org/10.1117/12.839253
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