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Solving the micro-to-macro spatial scale problem with milliprobe x-ray fluorescence/x-ray spectrum imaging
Recent developments in the understanding and application of backscattered and secondary electrons in the SEM
Test objects for automated dimensional measurements at the nanoscale level using a scanning electron microscope
On the relationship between hidden Markov models and convex functional transforms for simulating scanning probe microscopy
Monte Carlo simulation to determine the measurement uncertainty of a metrological scanning probe microscope measurement
Identification of scanning probe microscopes sensor heads and validation of a mechanical model by a laser vibrometer
Applying fluorescence microscopy to the investigation of the behavior of foodborne pathogens on produce