Plenary Session
Proc. SPIE 7378, New prospects for electron beams as tools for semiconductor lithography, 737802 (22 May 2009); doi: 10.1117/12.822771
Proc. SPIE 7378, XHR SEM: enabling extreme high resolution scanning electron microscopy, 737803 (22 May 2009); doi: 10.1117/12.824749
Helium Ion Microscopy I
Proc. SPIE 7378, Recent progress in understanding the imaging and metrology using the helium ion microscope, 737808 (22 May 2009); doi: 10.1117/12.824533
Helium Ion Microscopy II
Proc. SPIE 7378, Application of He ion microscopy for material analysis, 73780C (22 May 2009); doi: 10.1117/12.825735
Sample Preparation Technology
Proc. SPIE 7378, Novel choices for formulating embedding media kits, 73780F (22 May 2009); doi: 10.1117/12.821821
Focused Ion Beam Microscopy I
Proc. SPIE 7378, Methodologies for the preparation of soft materials using cryoFIB SEM, 73780G (22 May 2009); doi: 10.1117/12.821834
Proc. SPIE 7378, FIB/SEM cell sectioning for intracellular metal granules characterization, 73780I (22 May 2009); doi: 10.1117/12.821796
Focused Ion Beam Microscopy II
Proc. SPIE 7378, Implementation of ion-beam techniques in microsystems manufacturing: opportunities in cell biology, 73780K (22 May 2009); doi: 10.1117/12.820667
Microspectroscopic Characterization with Multiple Probes I
Proc. SPIE 7378, Advanced methods in scanning x-ray microscopy, 73780O (22 May 2009); doi: 10.1117/12.821823
Proc. SPIE 7378, Solving the micro-to-macro spatial scale problem with milliprobe x-ray fluorescence/x-ray spectrum imaging, 73780P (3 June 2009); doi: 10.1117/12.824629
Proc. SPIE 7378, Characterizing heterogeneous particles with SEM/SDD-EDS mapping and NIST Lispix, 73780Q (3 June 2009); doi: 10.1117/12.820874
Microspectroscopic Characterization with Multiple Probes II
Proc. SPIE 7378, IR analysis of polyvinylidene fluoride doped with transition metal halides, 73780T (22 May 2009); doi: 10.1117/12.820521
Proc. SPIE 7378, X-ray analysis of polyvinylidene fluoride doped with transition metal halides, 73780U (22 May 2009); doi: 10.1117/12.819433
Scanning Electron Microscopies I
Proc. SPIE 7378, Extreme high resolution scanning electron microscopy (XHR SEM) and beyond, 73780W (22 May 2009); doi: 10.1117/12.821826
Proc. SPIE 7378, The role of oxygen in secondary electron contrast of doped semiconductors in LVSEM, 73780Y (22 May 2009); doi: 10.1117/12.821810
Proc. SPIE 7378, Recent developments in the understanding and application of backscattered and secondary electrons in the SEM, 73780Z (22 May 2009); doi: 10.1117/12.821809
Scanning Electron Microscopies II
Proc. SPIE 7378, Variable probe current using a condenser lens in a miniature electron beam column, 737810 (22 May 2009); doi: 10.1117/12.821805
Proc. SPIE 7378, Russian standards for dimensional measurements for nanotechnologies, 737812 (22 May 2009); doi: 10.1117/12.821760
Proc. SPIE 7378, Test objects for automated dimensional measurements at the nanoscale level using a scanning electron microscope, 737813 (22 May 2009); doi: 10.1117/12.821759
Particle Beam Interaction Modeling Workshop
Proc. SPIE 7378, On the relationship between hidden Markov models and convex functional transforms for simulating scanning probe microscopy, 737814 (22 May 2009); doi: 10.1117/12.824187
Proc. SPIE 7378, Optimization of accurate SEM imaging by use of artificial images, 737815 (22 May 2009); doi: 10.1117/12.823415
Proc. SPIE 7378, Monte Carlo simulation to determine the measurement uncertainty of a metrological scanning probe microscope measurement, 737816 (22 May 2009); doi: 10.1117/12.821794
Proc. SPIE 7378, Modeling of charge and discharge in scanning electron microscopy, 737818 (22 May 2009); doi: 10.1117/12.828575
Atomic Force and Scanned Probe Microscopies I
Proc. SPIE 7378, Automated nanoscale AFM measurements using a-priori-knowledge, 73781A (22 May 2009); doi: 10.1117/12.821621
Proc. SPIE 7378, Identification of scanning probe microscopes sensor heads and validation of a mechanical model by a laser vibrometer, 73781B (22 May 2009); doi: 10.1117/12.821781
Proc. SPIE 7378, Kelvin probe force microscopy: measurement data reconstruction, 73781C (22 May 2009); doi: 10.1117/12.821787
Atomic Force and Scanned Probe Microscopies II
Proc. SPIE 7378, A control approach to cross coupling compensation of piezotube scanners in tapping-mode imaging, 73781E (22 May 2009); doi: 10.1117/12.821813
Proc. SPIE 7378, Enabling accurate gate profile control with inline 3D-AFM, 73781G (22 May 2009); doi: 10.1117/12.824203
Microscopy and Analysis of Food Microstructures
Proc. SPIE 7378, Scanning electron microscopy in characterizing seeds of some leguminous trees, 73781I (22 May 2009); doi: 10.1117/12.821814
Proc. SPIE 7378, Fresh fruit: microstructure, texture, and quality, 73781J (22 May 2009); doi: 10.1117/12.821351
Proc. SPIE 7378, Microstructure and nutrient distribution in oats: influence on quality, 73781K (22 May 2009); doi: 10.1117/12.821659
Microscopy and Analysis of Biological Materials I
Proc. SPIE 7378, Characterization of some biological specimens using TEM and SEM, 73781N (22 May 2009); doi: 10.1117/12.821825
Microscopy and Analysis of Biological Materials II
Proc. SPIE 7378, Construction of a new type of low-energy scanning electron microscope with atomic resolution, 73781S (22 May 2009); doi: 10.1117/12.824180
Proc. SPIE 7378, Multiscale 3D bioimaging: from cell, tissue to whole organism, 73781V (22 May 2009); doi: 10.1117/12.828043
Microscopy Applications in Environmental Safety and Health
Proc. SPIE 7378, Quantum dot conjugates for SEM of bacterial communities, 73781Y (22 May 2009); doi: 10.1117/12.824201
Optical Microscopies I
Proc. SPIE 7378, A novel confocal line scanning sensor, 737822 (22 May 2009); doi: 10.1117/12.821205
Optical Microscopies II
Proc. SPIE 7378, Hybrid FDTD-Fresnel modeling of the scanning confocal microscopy, 737826 (22 May 2009); doi: 10.1117/12.821824
Proc. SPIE 7378, Three-dimensional image formation under single-photon ultra-short pulsed illumination, 737827 (22 May 2009); doi: 10.1117/12.822773
Optical Characterization of Biological Materials
Proc. SPIE 7378, Microspectroscopic method for determination of size and distribution of protein complexes in vivo, 737829 (22 May 2009); doi: 10.1117/12.821831
Proc. SPIE 7378, Applying fluorescence microscopy to the investigation of the behavior of foodborne pathogens on produce, 73782A (22 May 2009); doi: 10.1117/12.821816
Proc. SPIE 7378, Transport imaging with near-field scanning optical microscopy, 73782B (22 May 2009); doi: 10.1117/12.824114
Applications of Scanning Microscopy to Forensics Science II
Proc. SPIE 7378, Use of a scanning optical profilometer for toolmark characterization, 73782D (22 May 2009); doi: 10.1117/12.825185
Proc. SPIE 7378, Forensic document analysis using scanning microscopy, 73782E (22 May 2009); doi: 10.1117/12.825186
Proc. SPIE 7378, Gunshot residue inserted under hair scales as a result of a muzzle blast, 73782G (22 May 2009); doi: 10.1117/12.827362
Proc. SPIE 7378, SEM-EDX analysis of an unknown "known" white powder found in a shipping container from Peru, 73782H (22 May 2009); doi: 10.1117/12.827278
Applications of Scanning Microscopy to Forensics Science III
Proc. SPIE 7378, Quality assurance aspects of GSR analysis by SEM/EDX: a report of first-hand experiences, 73782I (22 May 2009); doi: 10.1117/12.827583
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