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22 May 2009 Advanced methods in scanning x-ray microscopy
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Proceedings Volume 7378, Scanning Microscopy 2009; 73780O (2009) https://doi.org/10.1117/12.821823
Event: SPIE Scanning Microscopy, 2009, Monterey, California, United States
Abstract
New developments in X-ray instrumentation and analysis have facilitated the development and improvement of various scanning X-ray microscopy techniques. In this contribution, we offer an overview of recent scanning hard X-ray microscopy measurements performed at the Swiss Light Source. We discuss scanning transmission X-ray microscopy in its transmission, phase contrast, and dark-field imaging modalities. We demonstrate how small-angle X-ray scattering analysis techniques can be used to yield additional information. If the illumination is coherent, coherent diffraction imaging techniques can be brought to bear. We discuss how, from scanning microscopy measurements, detailed measurements of the X-ray scattering distributions can be used to extract high-resolution images. These microscopy techniques with their respective imaging power can easily be combined to multimodal X-ray microscopy.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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