22 May 2009 X-ray analysis of polyvinylidene fluoride doped with transition metal halides
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Proceedings Volume 7378, Scanning Microscopy 2009; 73780U (2009) https://doi.org/10.1117/12.819433
Event: SPIE Scanning Microscopy, 2009, Monterey, California, United States
Abstract
Pure and doped polyvinylidene fluoride (PVDF) films were prepared by casting. Films with various concentrations of transition metal halides TMHs (AlCl3, ZnCl2, and CoCl2) were prepared. The microstructure and physical properties of these films were studied by X-ray diffraction (XRD). The two factors affecting the interaction between the PVDF and MHs are (i) the dopant weight fraction (Hc) (0.05% -30%) by weight, and (ii) precasting time (tpc) which is the time during which the PVDF pellets are maintained solved with the halides added before casting. From the qualitative analysis of XRD, the addition of MHs to the undoped PVDF film enhances the appearance of the important β-phase without the need for mechanical drawing treatment. The precasting time plays a role for new crystalline structures to appear which becomes strong for CoCl2 doping, moderate in ZnCl2 doping and weak in AlCl3 doping. Annealing and Corona poling have a negative effect on the new crystalline structures hence their peaks in X-ray diffraction are reduced. The stability of these structures in the samples doped with CoCl2 is high compared to the doping with ZnCl2 and AlCl3.
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Somia M. El Hefnawy, Somia M. El Hefnawy, Mervet M. Aboelkher, Mervet M. Aboelkher, H. Abdelkader, H. Abdelkader, } "X-ray analysis of polyvinylidene fluoride doped with transition metal halides", Proc. SPIE 7378, Scanning Microscopy 2009, 73780U (22 May 2009); doi: 10.1117/12.819433; https://doi.org/10.1117/12.819433
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