24 August 2009 Optimum design for maximum wavelength resolution based on the edge filter ratiometric system
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Proceedings Volume 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors; 73810H (2009) https://doi.org/10.1117/12.831418
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China
Abstract
This paper provides an analysis of the influence of a range of factors on the resolution of the ratiometric wavelength measurement system including the slope of the edge filter, the spectral nature of the input optical signal and the working wavelength range. Our investigations show that, for a given input optical signal and when the working wavelength range is known, it is relatively straightforward to select an optimum slope for the edge filter that will yield a maximum resolution for the system.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qiang Wu, Ginu Rajan, Pengfei Wang, Yuliya Semenova, Gerald Farrell, "Optimum design for maximum wavelength resolution based on the edge filter ratiometric system", Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 73810H (24 August 2009); doi: 10.1117/12.831418; https://doi.org/10.1117/12.831418
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