The Debye characteristic temperature of nanodiamond thin films

Yongjie Wang; Qingxun Zhao; Zhanlong Zhao; Zengqian Yin; Qian Yang; Han Li

doi:10.1117/12.834548

24 August 2009 The Debye characteristic temperature of nanodiamond thin films

Yongjie Wang, Qingxun Zhao, Zhanlong Zhao, Zengqian Yin, Qian Yang, Han Li

Proceedings Volume 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors; 73810R (2009) https://doi.org/10.1117/12.834548
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

The Debye characteristic temperature is a useful parameter of nanodiamond thin films. In this paper, the Debye characteristic temperature of diamond thin films is studied through X-ray diffraction intensity at a fixed temperature. From x-ray diffraction, we can get the average crystallite size of diamond thin film. By the method of Xueshan Lu and Jingkui Liang, the Debye-Waller factor and Debye temperature are calculated, they are B=0.010937 nm² and Θ_D=527.95K, the Debye temperature is about one-fourth of the Debye characteristic temperature of the bulk diamond single crystal (about 2200K). The relationship between crystal size and Debye characteristic temperature is also discussed. The Debye characteristic temperature depends on particle size. When the diamond changes from bulk diamond to diamond films, the crystal size of diamond becomes smaller, so the Debye characteristic temperature becomes lower. This means that the atom binding force becomes weak, and it can increase the activity of nanodiamond thin films.

Citation Download Citation

Yongjie Wang, Qingxun Zhao, Zhanlong Zhao, Zengqian Yin, Qian Yang, and Han Li "The Debye characteristic temperature of nanodiamond thin films", Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 73810R (24 August 2009); https://doi.org/10.1117/12.834548

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