24 August 2009 Modeling of measurement sensitivity of refractive index based on surface plasmon resonance of LPFGs
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Proceedings Volume 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors; 73812P (2009) https://doi.org/10.1117/12.835038
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China
Abstract
In this paper, we developed a four-layer theory that is capable of calculating LPFGs with real metallic coatings using matrix method. The resonant spectrum characteristics of LPFGs coated with various metallic films are investigated in detail. The resonant wavelength shifts of LPFGs with the change of refractive index of surrounding media over different metallic thicknesses are obtained. It is found theoretically that there exists an optimal range of metallic thickness within which the maximal measurement sensitivity for the refractive index change of surrounding media can be obtained.
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Difeng Ma, Chinhua Wang, Guiju Zhang, Minfu Zhao, "Modeling of measurement sensitivity of refractive index based on surface plasmon resonance of LPFGs", Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 73812P (24 August 2009); doi: 10.1117/12.835038; https://doi.org/10.1117/12.835038
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