Molecular dynamics study on Young's modulus of silicon nanostructures at finite temperature

Yabin Wang; Hong Yu

doi:10.1117/12.836706

24 August 2009 Molecular dynamics study on Young's modulus of silicon nanostructures at finite temperature

Yabin Wang, Hong Yu

Proceedings Volume 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors; 73812U (2009) https://doi.org/10.1117/12.836706
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

In this paper, we investigate Young's modulus of Si nanofilms and Si nanowires under surface reconstruction with different temperature range from 100K to 800K by Molecular dynamics simulations. Young's modulus is calculated from energy-strain relationship. The results show that the Young's modulus of Si nanofilms decreases as temperature increases. The temperature effect on Young's modulus of Si nanowires also could not be ignored. Surface effect on nanostructures is more significant than on macrostructures, and Si nanostructures are more sensitive to heat.

Citation Download Citation

Yabin Wang and Hong Yu "Molecular dynamics study on Young's modulus of silicon nanostructures at finite temperature", Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 73812U (24 August 2009); https://doi.org/10.1117/12.836706

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