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28 August 2009 Polarization characteristic of laser backscattering from randomly rough surfaces
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Proceedings Volume 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging; 73821Y (2009) https://doi.org/10.1117/12.835036
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China
Abstract
The polarization characteristic of laser backscattering from randomly rough surfaces is studied theoretically and experimentally in this paper. The effect of multiple scattering from rough surfaces is analyzed. The equation for the backscattering coefficient and the polarization of Gaussian rough surfaces are derived and the simulation is conducted under several certain conditions. The polarization characteristics of different materials with different shapes are measured. The experimental results and the simulated numerical values are compared and analyzed in detail.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiping Cai, Yanshan Chen, Lei Chen, and Wei Li "Polarization characteristic of laser backscattering from randomly rough surfaces", Proc. SPIE 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging, 73821Y (28 August 2009); https://doi.org/10.1117/12.835036
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