Comparative research on femtosecond laser and nanosecond laser induced damage to CCD

Jing-jing Dai; Zhi-yong Wang

doi:10.1117/12.835560

31 August 2009 Comparative research on femtosecond laser and nanosecond laser induced damage to CCD

Jing-jing Dai, Zhi-yong Wang

Proceedings Volume 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging; 73823S (2009) https://doi.org/10.1117/12.835560
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

The contrastive damage experiments of CCD irradiated by 800nm femtosecond laser with the pulse duration of 330fs and 1064nm laser with the pulse duration of 10ns were studied from the energy density and power density. The failure problems of the CCD devices irradiated by the two kinds of laser pulses were studied. The experimental results show that the failure threshold of CCD irradiated by femtosecond laser is 2.3 nJ / cm² and it is 3~4 order lower than that by nanosecond laser. According to the micro-analysis of CCD, it is found that the damage takes place at the light activated elements.

Citation Download Citation

Jing-jing Dai and Zhi-yong Wang "Comparative research on femtosecond laser and nanosecond laser induced damage to CCD", Proc. SPIE 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging, 73823S (31 August 2009); https://doi.org/10.1117/12.835560

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