31 August 2009 Numerical study of reflection imaging technique for measurement of optical nonlinearity
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Proceedings Volume 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging; 738243 (2009) https://doi.org/10.1117/12.835673
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China
Abstract
A single-laser-shot reflection imaging technique, which can measure the nonlinear optical refraction of the surface of material possessing limited transparency, is present. Using the model of the reflection 4f coherent imaging system with phase object, we analyze the phase and amplitude characteristics of the beam reflected from the interface. With the help of computer and MATLAB, we have done some theoretical analysis and got some conclusions including advantages and disadvantages. Our model and its corresponding simulation is presented in order to validate our approach.
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Qijing Cai, Qijing Cai, Junyi Yang, Junyi Yang, Yinglin Song, Yinglin Song, } "Numerical study of reflection imaging technique for measurement of optical nonlinearity", Proc. SPIE 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging, 738243 (31 August 2009); doi: 10.1117/12.835673; https://doi.org/10.1117/12.835673
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